2019•Engineering Failure AnalysisRequires access

Integrated circuit failure analysis and reliability prediction based on physics of failure

Jian Jiao, Xinlin De, Zhiwei Chen, Tingdi Zhao

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Key concepts: Physics of failure, Reliability (semiconductor), Reliability engineering, Printed circuit board, Monte Carlo method, Finite element method, Failure rate, Computer science

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Integrated circuit failure analysis and reliability prediction based on physics of failure — Research Paper | ScholarLens