Failure Rate Model of Microwave Vacuum Electronic Devices

Based upon the field usage data and failure models,quantitative reliability level of reliability level of magnetrons in China was offered.Efforts have been made by employing reliability theory to determine the reliability failure rate of vacuum electronic devices in terms of failure rate and average lifetime,By comparing the failure models in the new edition of electronic equipment reliability prediction handbook(GJB299B) with the old edition(GJB 299 A), it has been proved that the prediction failure models of the new edition are more close to actualty than those of old edition,and the precision is obviously increased.This new established mathematical models is practical and it can satisfy the requirements of most engineering application.