1999Journal of the Textile InstituteRequires access

X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Study of the Tarnishing of Metal-coated Textiles

David Howell, R. Mitchell, Chris Carr, John Walton

Open publisher page 5 citations

Abstract

The nature of the corrosion present on the surface of gold-coated silver thread has been studied. The surface-sensitive XPS technique has demonstrated silver migration to the surface and subsequent reaction with atmospheric sulphur. The influence of associated sulphur-containing textile fibres has been investigated and the presence of other unidentified surface contaminants demonstrated by XPS and ToF-SIMS.

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The nature of the corrosion present on the surface of gold-coated silver thread has been studied. The surface-sensitive XPS technique has demonstrated silver migration to the surface and subsequent reaction with atmospheric sulphur. The influence of associated sulphur-containing textile fibres has been investigated and the presence of other unidentified surface contaminants demonstrated by XPS and ToF-SIMS.

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OpenAlex reports 5 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

The nature of the corrosion present on the surface of gold-coated silver thread has been studied. The surface-sensitive XPS technique has demonstrated silver migration to the surface and subsequent reaction with atmospheric sulphur. The influence of associated sulphur-containing textile fibres has been investigated and the presence of other unidentified surface contaminants demonstrated by XPS and ToF-SIMS.

Key concepts: X-ray photoelectron spectroscopy, Secondary ion mass spectrometry, Metal, Mass spectrometry, Materials science, Sulfur, Analytical Chemistry (journal), Static secondary-ion mass spectrometry

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X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Study of the Tarnishing of Metal-coated Textiles — Research Paper | ScholarLens