1973•Surface ScienceRequires access
Investigation of surface layers by SIMS and SIIMS
H. W. Werner, H. A. M. de Grefte
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Abstract
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H. W. Werner, H. A. M. de Grefte
Abstract
An abstract is not available in the OpenAlex record for this paper.
OpenAlex reports 47 citations for this work. Citation counts describe recorded attention and do not establish research quality.
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Key concepts: Secondary ion mass spectrometry, Static secondary-ion mass spectrometry, Mass spectrometry, Ion, Chemistry, Analytical Chemistry (journal), Ion beam, Argon