A 0.8 μm CMOS, Double Polysilicon EEPROM Technology Module Optimized for Minimum Wafer Cost
P. Cacharelis, D. Hoffstetter, Sebastian Schmidt, J. L. Nilles, John Gough, J. Smillie
Abstract
P. Cacharelis, D. Hoffstetter, Sebastian Schmidt, J. L. Nilles, John Gough, J. Smillie
Abstract
A novel process technology has been developed for smart analog and mixed-signal products requiring embedded EEPROM. The technology is a modular addition to a 0.8 μm, single polysilicon, double metal baseline CMOS process. The EEPROM process architecture is defined with the primary goal of minimizing the number of additional process steps driven by wafer cost considerations. A double polysilicon architecture is chosen to allow for the formation of an integral, linear interpoly capacitor and to reduce the EEPROM cell size. The module requires 3 additional masks beyond those of the baseline CMOS and adds 20% to the wafer cost. An anti-lock braking system (ABS) chip with a 64 byte EEPROM core has been designed and fabricated to demonstrate the technology.
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A novel process technology has been developed for smart analog and mixed-signal products requiring embedded EEPROM. The technology is a modular addition to a 0.8 μm, single polysilicon, double metal baseline CMOS process. The EEPROM process architecture is defined with the primary goal of minimizing the number of additional process steps driven by wafer cost considerations. A double polysilicon architecture is chosen to allow for the formation of an integral, linear interpoly capacitor and to reduce the EEPROM cell size. The module requires 3 additional masks beyond those of the baseline CMOS and adds 20% to the wafer cost. An anti-lock braking system (ABS) chip with a 64 byte EEPROM core has been designed and fabricated to demonstrate the technology.
Key concepts: EEPROM, CMOS, Wafer, EPROM, Modular design, Embedded system, Computer hardware, Chip