Reliability prediction of electronic components on PCB using PRISM specification
Seungwoo Lee, Hwa-Ki Lee
Abstract
Seungwoo Lee, Hwa-Ki Lee
Abstract
The reliability prediction and evaluation for general electronic components are required to guarantee in quality and in efficiency. Although many methodologies for predicting the reliability of electronic components have been developed, their reliability might be subjective according to a particular set of circumstances, and therefore it is not easy to quantify their reliability. In this study reliability prediction of electronic components, that is the interface card, which is used in the CNC(Computerized Numerical Controller) of machine tools, was carried out using PRISM reliability prediction specification. Reliability performances such as MTBF(Mean Time Between Failure), failure rate and reliability were obtained, and the variation of failure rate for electronic components according to temperature change was predicted. The results obtained from this study are useful information to consider a counter plan for weak components before they are used.
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The reliability prediction and evaluation for general electronic components are required to guarantee in quality and in efficiency. Although many methodologies for predicting the reliability of electronic components have been developed, their reliability might be subjective according to a particular set of circumstances, and therefore it is not easy to quantify their reliability. In this study reliability prediction of electronic components, that is the interface card, which is used in the CNC(Computerized Numerical Controller) of machine tools, was carried out using PRISM reliability prediction specification. Reliability performances such as MTBF(Mean Time Between Failure), failure rate and reliability were obtained, and the variation of failure rate for electronic components according to temperature change was predicted. The results obtained from this study are useful information to consider a counter plan for weak components before they are used.
Key concepts: Reliability (semiconductor), Reliability engineering, Mean time between failures, Failure rate, Computer science, Prism, Electronic component, Quality (philosophy)