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2021•2021 17th Conference on Electrical Machines, Drives and Power Systems (ELMA)Requires access

A “Single Component” Approach for Electronic Units’ Reliability Prediction

Toncho Papanchev, Angel Marinov, Julia Garipova

Open publisher page 3 citations

Abstract

This paper presents a reliability prediction approach for electronic units during their operation, in order to optimize the maintenance process especially when reliability-centered maintenance is conducted. For this purpose, based on the reliability prediction methodology FIDES2009, the most appropriate parameters and equations are fetched out to be combined in a suitable approach for estimating the physical reliability of an electronic unit with various complexity, considering it as a single component.

About this research paper

What this paper is about

This paper presents a reliability prediction approach for electronic units during their operation, in order to optimize the maintenance process especially when reliability-centered maintenance is conducted. For this purpose, based on the reliability prediction methodology FIDES2009, the most appropriate parameters and equations are fetched out to be combined in a suitable approach for estimating the physical reliability of an electronic unit with various complexity, considering it as a single component.

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OpenAlex reports 3 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

This paper presents a reliability prediction approach for electronic units during their operation, in order to optimize the maintenance process especially when reliability-centered maintenance is conducted. For this purpose, based on the reliability prediction methodology FIDES2009, the most appropriate parameters and equations are fetched out to be combined in a suitable approach for estimating the physical reliability of an electronic unit with various complexity, considering it as a single component.

Key concepts: Reliability (semiconductor), Component (thermodynamics), Reliability engineering, Computer science, Process (computing), Reliability theory, Electronic component, Engineering

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