1986AEDS JournalRequires access

Validation Studies of a New Computer Attitude Scale

Clarice P. Gressard, Brenda H. Loyd

Open publisher page 160 citations

Abstract

To explore the usefulness of a new instrument, the Computer Attitude Scale, its subsidies (Computer Anxiety, Computer Confidence, Computer Liking) were subjected to two validation studies. The first study examined the reliability and factorial validity of the subscales. The second study analyzed the results of preprogram-postprogram administration of the subscales. The results of the studies suggest that the Computer Attitude Scale is a convenient. reliable and valid measure of computer attitudes, and that it can be confidently and effectively utilized in research and program evaluation contexts.

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What this paper is about

To explore the usefulness of a new instrument, the Computer Attitude Scale, its subsidies (Computer Anxiety, Computer Confidence, Computer Liking) were subjected to two validation studies. The first study examined the reliability and factorial validity of the subscales. The second study analyzed the results of preprogram-postprogram administration of the subscales. The results of the studies suggest that the Computer Attitude Scale is a convenient. reliable and valid measure of computer attitudes, and that it can be confidently and effectively utilized in research and program evaluation contexts.

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Available abstract

To explore the usefulness of a new instrument, the Computer Attitude Scale, its subsidies (Computer Anxiety, Computer Confidence, Computer Liking) were subjected to two validation studies. The first study examined the reliability and factorial validity of the subscales. The second study analyzed the results of preprogram-postprogram administration of the subscales. The results of the studies suggest that the Computer Attitude Scale is a convenient. reliable and valid measure of computer attitudes, and that it can be confidently and effectively utilized in research and program evaluation contexts.

Key concepts: Scale (ratio), Reliability (semiconductor), Computer science, Applied psychology, Anxiety, Psychology, Test validity, Psychometrics

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