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High-temperature contact potential difference measurement of surface work function using in vacuo Kelvin probe

Antonio M. Mántica, Michael J. Detisch, T. John Balk

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Key concepts: Thermionic emission, Kelvin probe force microscope, Work function, Volta potential, Work (physics), Vacuum level, Function (biology), Materials science

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High-temperature contact potential difference measurement of surface work function using in vacuo Kelvin probe — Research Paper | ScholarLens