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Surface investigations with a Kelvin probe force microscope

M. Nonnenmacher, M. O’Boyle, H. K. Wickramasinghe

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Key concepts: Volta potential, Kelvin probe force microscope, Microscope, Work function, Scanning probe microscopy, Potential difference, Surface (topology), Resolution (logic)

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Surface investigations with a Kelvin probe force microscope — Research Paper | ScholarLens