Performance Evaluation of Analog Circuits with Deep Submicrometer MOSFETs in the Subthreshold Regime of Operation
Yasuhisa Ōmura, Abhijit Mallik, Naoto Matsuo
Abstract
Yasuhisa Ōmura, Abhijit Mallik, Naoto Matsuo
Abstract
In this chapter, the analog performance of conventional deep submicrometer metal oxide semiconductor field-effect transistors (MOSFETs) in the subthreshold region is studied in terms of transconductance g m and transconductance-to-drain-current ratio g m /I D . An improved drift-diffusion-based current model is proposed, which is used to predict the analog performance. Very good agreement between the simulation results and the corresponding model predictions is obtained.
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In this chapter, the analog performance of conventional deep submicrometer metal oxide semiconductor field-effect transistors (MOSFETs) in the subthreshold region is studied in terms of transconductance g m and transconductance-to-drain-current ratio g m /I D . An improved drift-diffusion-based current model is proposed, which is used to predict the analog performance. Very good agreement between the simulation results and the corresponding model predictions is obtained.
Key concepts: Transconductance, Subthreshold conduction, Transistor, Subthreshold slope, Materials science, MOSFET, Analogue electronics, Diffusion