1992•Medical Entomology and ZoologyRequires access

Secondary ion mass spectrometry : SIMS VIII : Proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry (SIMS VIII)

A. Benninghoven

Abstract

Fundamentals quantification instrumentation surface analysis depth profiling imaging post-ionization combined and/or related techniques applications biology isotopic analysis - geology metals and oxides polymers - organics semiconductors Morrison symposium.

About this research paper

What this paper is about

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Key concepts: Secondary ion mass spectrometry, Static secondary-ion mass spectrometry, Mass spectrometry, Ion-mobility spectrometry–mass spectrometry, Chemistry, Ion, Analytical Chemistry (journal), Selected reaction monitoring