ScholarLens Back to search
1994•Wiley eBooksRequires access

Secondary ion mass spectrometry : SIMS IX : Proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX) : the Hotel Yokohama and the Sangyo-Boeki Center Building Yokohama, Japan 7-12 November, 1993

A. Benninghoven

Open publisher page 1 citations

Abstract

Fundamentals Quantification Instrumentation Post Ionization CsX+-SIMS ToF-SIMS Surface Analysis Combined Techniques Imaging and Focused Ion Beam Applications Depth Profiling and Semiconductors Organic and Biological Materials Insulators and Metals Geological Materials Environmental Problems Workshops.

About this research paper

What this paper is about

Fundamentals Quantification Instrumentation Post Ionization CsX+-SIMS ToF-SIMS Surface Analysis Combined Techniques Imaging and Focused Ion Beam Applications Depth Profiling and Semiconductors Organic and Biological Materials Insulators and Metals Geological Materials Environmental Problems Workshops.

Why it matters

OpenAlex reports 1 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Fundamentals Quantification Instrumentation Post Ionization CsX+-SIMS ToF-SIMS Surface Analysis Combined Techniques Imaging and Focused Ion Beam Applications Depth Profiling and Semiconductors Organic and Biological Materials Insulators and Metals Geological Materials Environmental Problems Workshops.

Key concepts: Secondary ion mass spectrometry, Mass spectrometry, Static secondary-ion mass spectrometry, Accelerator mass spectrometry, Ion, Analytical Chemistry (journal), Ion beam analysis, Chemistry

Related papers

Related paper 1Related paper 2Related paper 3
Back to paper searchBrowse research topicsOriginal source
Secondary ion mass spectrometry : SIMS IX : Proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX) : the Hotel Yokohama and the Sangyo-Boeki Center Building Yokohama, Japan 7-12 November, 1993 — Research Paper | ScholarLens