2014Encyclopedia of Environmental ChangeRequires access

SECONDARY ION MASS SPECTROMETRY (SIMS)

John A. Matthews

Open publisher page 1 citations

Abstract

Transmission electron microscopy (TEM)/Secondary ion mass spectrometry (SIMS) biofilm sample preparation: Samples of biofilm were fixed with 4 % glutaraldehyde, as described previously (S1). TEM images (Fig. S4) confirm that, because the sectioning resin neither displaces nor damages finescale biofilm features, ultramicrotomed samples of biofilm used for TEM imaging were also suitable for SIMS analyses.

About this research paper

What this paper is about

Transmission electron microscopy (TEM)/Secondary ion mass spectrometry (SIMS) biofilm sample preparation: Samples of biofilm were fixed with 4 % glutaraldehyde, as described previously (S1). TEM images (Fig. S4) confirm that, because the sectioning resin neither displaces nor damages finescale biofilm features, ultramicrotomed samples of biofilm used for TEM imaging were also suitable for SIMS analyses.

Why it matters

OpenAlex reports 1 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Transmission electron microscopy (TEM)/Secondary ion mass spectrometry (SIMS) biofilm sample preparation: Samples of biofilm were fixed with 4 % glutaraldehyde, as described previously (S1). TEM images (Fig. S4) confirm that, because the sectioning resin neither displaces nor damages finescale biofilm features, ultramicrotomed samples of biofilm used for TEM imaging were also suitable for SIMS analyses.

Key concepts: Secondary ion mass spectrometry, Static secondary-ion mass spectrometry, Mass spectrometry, Ion-mobility spectrometry–mass spectrometry, Chemistry, Ion, Analytical Chemistry (journal), Mass spectrometry imaging

Related papers

Back to paper searchBrowse research topicsOriginal source
SECONDARY ION MASS SPECTROMETRY (SIMS) — Research Paper | ScholarLens