Optical and Electron Microscopy for Analysis of Nanomaterials
Hyo-Yeon Kim, Michael M. Murata, Hyejin Chang, Sang Hun Lee, Jaehi Kim, Jong Hun Lee, Won‐Yeop Rho, Bong‐Hyun Jun
Abstract
Hyo-Yeon Kim, Michael M. Murata, Hyejin Chang, Sang Hun Lee, Jaehi Kim, Jong Hun Lee, Won‐Yeop Rho, Bong‐Hyun Jun
Abstract
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Key concepts: Transmission electron microscopy, Scanning electron microscope, Microscopy, Scanning confocal electron microscopy, Nanotechnology, Electron microscope, Energy filtered transmission electron microscopy, Characterization (materials science)