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New active probe for scanning near field optical microscopy

Hongshi Chen, Régis Déturche, Jean-Louis Bijeon, Jérôme Plain, Renaud Bachelot

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Key concepts: Microscopy, Near-field scanning optical microscope, Optical microscope, Optics, Materials science, Scanning probe microscopy, Field (mathematics), Optoelectronics

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New active probe for scanning near field optical microscopy — Research Paper | ScholarLens