2018Unpublished venueOpen access

Novel Applications of Near-Field Scanning Optical Microscopy (NSOM)

Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States), Craig Nakakura, USDOE National Nuclear Security Administration (NNSA), Sandia National Laboratories (SNL-CA), Livermore, CA (United States), Aaron Katzenmeyer, David Scrymgeour, Jeffry J. Sniegowski, Joachim H. Clement

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Abstract

The Near-Field Scanning Optical Microscope (NSOM) was used to image a wide array samples using a variety of standard and non-standard operating conditions on a custom system built in Org. 5625. The ability of this technique to produce highquality images was assessed during this one year LDRD. To obtain details about the devices imaged, as well as the experimental details, please refer to the classified report from the project manager, Rich Dondero, or the NSP IA lead, Kristina Czuchlewski.

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What this paper is about

The Near-Field Scanning Optical Microscope (NSOM) was used to image a wide array samples using a variety of standard and non-standard operating conditions on a custom system built in Org. 5625. The ability of this technique to produce highquality images was assessed during this one year LDRD. To obtain details about the devices imaged, as well as the experimental details, please refer to the classified report from the project manager, Rich Dondero, or the NSP IA lead, Kristina Czuchlewski.

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Available abstract

The Near-Field Scanning Optical Microscope (NSOM) was used to image a wide array samples using a variety of standard and non-standard operating conditions on a custom system built in Org. 5625. The ability of this technique to produce highquality images was assessed during this one year LDRD. To obtain details about the devices imaged, as well as the experimental details, please refer to the classified report from the project manager, Rich Dondero, or the NSP IA lead, Kristina Czuchlewski.

Key concepts: Near-field scanning optical microscope, Optical microscope, Materials science, Microscopy, Optics, Polishing, Laser, Resolution (logic)

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