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Near-field scanning optical microscopy/spectroscopy in molecular aggregates and polymers

David A. Vanden Bout, Daniel A. Higgins, Josef Kerimo, P. F. Barbara

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Abstract

Near-field scanning optical microscopy (NSOM) combines high-resolution force microscopy with nanometer-resolution optical imaging. NSOM, therefore, has the power not only to resolve optical features on the tens of nanometer distance scale, but it can also correlate those features to topography. The results of the NSOM studies of numerous aggregated systems is reported.

About this research paper

What this paper is about

Near-field scanning optical microscopy (NSOM) combines high-resolution force microscopy with nanometer-resolution optical imaging. NSOM, therefore, has the power not only to resolve optical features on the tens of nanometer distance scale, but it can also correlate those features to topography. The results of the NSOM studies of numerous aggregated systems is reported.

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Method / approach

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Available abstract

Near-field scanning optical microscopy (NSOM) combines high-resolution force microscopy with nanometer-resolution optical imaging. NSOM, therefore, has the power not only to resolve optical features on the tens of nanometer distance scale, but it can also correlate those features to topography. The results of the NSOM studies of numerous aggregated systems is reported.

Key concepts: Near-field scanning optical microscope, Optical microscope, Microscopy, Materials science, Nanometre, Spectroscopy, Resolution (logic), Optics

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