Near-field scanning optical microscopy/spectroscopy in molecular aggregates and polymers
David A. Vanden Bout, Daniel A. Higgins, Josef Kerimo, P. F. Barbara
Abstract
David A. Vanden Bout, Daniel A. Higgins, Josef Kerimo, P. F. Barbara
Abstract
Near-field scanning optical microscopy (NSOM) combines high-resolution force microscopy with nanometer-resolution optical imaging. NSOM, therefore, has the power not only to resolve optical features on the tens of nanometer distance scale, but it can also correlate those features to topography. The results of the NSOM studies of numerous aggregated systems is reported.
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Near-field scanning optical microscopy (NSOM) combines high-resolution force microscopy with nanometer-resolution optical imaging. NSOM, therefore, has the power not only to resolve optical features on the tens of nanometer distance scale, but it can also correlate those features to topography. The results of the NSOM studies of numerous aggregated systems is reported.
Key concepts: Near-field scanning optical microscope, Optical microscope, Microscopy, Materials science, Nanometre, Spectroscopy, Resolution (logic), Optics