Switching Characteristics of Resonant Tunneling Diodes
Shilin Zhang, Guo Weilian, Liang Huilai, Pingjuan Niu, Zhenkun Wang
Abstract
Shilin Zhang, Guo Weilian, Liang Huilai, Pingjuan Niu, Zhenkun Wang
Abstract
Using a P8510( C) network analyzer, the scattering parameter ( S22 ) Of AlAs/ InGaAs/AlAs resonant tunneling diodes (RTD) is measured. Equivalent circuit parameters are obtained by curve fit. The RTD switching time is estimated by Using the measured capacitance and aVerage negatiVe differential resistance. The minimum rise time of the sample is estimated to be 21ps.
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Using a P8510( C) network analyzer, the scattering parameter ( S22 ) Of AlAs/ InGaAs/AlAs resonant tunneling diodes (RTD) is measured. Equivalent circuit parameters are obtained by curve fit. The RTD switching time is estimated by Using the measured capacitance and aVerage negatiVe differential resistance. The minimum rise time of the sample is estimated to be 21ps.
Key concepts: Quantum tunnelling, Diode, Resonant-tunneling diode, Capacitance, Materials science, Optoelectronics, Equivalent series resistance, Differential capacitance