2016•The Proceedings of Mechanical Engineering Congress JapanOpen access

Characterization of GaN films grown on GaN substrates

Kohei Sugimoto, Naoki Arita, Narihito Okada, Ryo Inomoto, Kazuyuki Tadatomo

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Key concepts: Materials science, Optoelectronics, Characterization (materials science), Gallium nitride, Wide-bandgap semiconductor, Nanotechnology, Layer (electronics)

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