Yu Liu, Ning Hua Zhu, Edwin Yue‐Bun Pun, Philip Chung
Abstract
Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.
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Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.
Key concepts: Parasitic extraction, Materials science, Diode, Laser, Semiconductor laser theory, Laser diode, Optoelectronics, Reflection coefficient