2015•Journal of Physics Conference SeriesOpen access

Mathematical modeling of piezoresistive elements

Matias Geremias, Rodrigo César Silva Moreira, Luiz Antônio Rasia, Alberto Moi

Abstract

This article presents the longitudinal piezoresistive coefficients for thin film amorphous semiconductor type a-C:H. Experimental data and mathematical models have been used in computer simulations. The results show that a reduction of the longitudinal piezoresistive coefficient occurs due to the increased concentration of impurities in the films analyzed.

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Key concepts: Piezoresistive effect, Materials science, Semiconductor, Amorphous solid, Impurity, Composite material, Optoelectronics, Physics