2015•Nanoscience and technologyRequires access
Scanning Probe Microscopy
Bert Voigtländer
Open publisher page 170 citations
Abstract
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Bert Voigtländer
Abstract
An abstract is not available in the OpenAlex record for this paper.
OpenAlex reports 170 citations for this work. Citation counts describe recorded attention and do not establish research quality.
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Key concepts: Scanning probe microscopy, Materials science, Scanning tunneling microscope, Microscopy, Scanning ion-conductance microscopy, Scanning Force Microscopy, Atomic force microscopy, Nanotechnology