2001•Advances in imaging and electron physicsRequires access

Recent developments of probes for scanning probe microscopy

E. Oesterschulze

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Key concepts: Scanning probe microscopy, Scanning ion-conductance microscopy, Vibrational analysis with scanning probe microscopy, Scanning capacitance microscopy, Scanning tunneling microscope, Conductive atomic force microscopy, Microscopy, Scanning gate microscopy

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