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Scanned Probe Microscopies: STM and Beyond

C. Neal Stewart

Abstract

This conference dealt with an array of scanning probe and other microscopy techniques based on various physical and chemical properties. Some of them are: Scanning Tunneling Microscopy STM, Scanning Electrochemical Microscopy SEM, Scanning Capacitance Microscopy SCM, Scanning Force Microscopy SFM, Atomic Force Microscopy AFM, Magnetic Force Microscopy, Photon STM, Ballistic Electronic Microscopy, Photo Tunneling Microscopy, Evanescent Field Optical Microscopy.

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Available abstract

Key concepts: Microscopy, Scanning tunneling microscope, Scanning ion-conductance microscopy, Scanning probe microscopy, Scanning capacitance microscopy, Conductive atomic force microscopy, Scanning confocal electron microscopy, Optical microscope