Reliability assessment technology for electronic equipment based on step-up-stress accelerated degradation testing

In order to evaluate the reliability of equipment with high reliability and long life quickly,the method of step-up-stress accelerated degradation testing was presented.First,step-up-stress accelerated degradation testing method and the basic assumptions were given,then data conversion method from step up stress degradation data to constant stress degradation data was expatiated;based on these,step up stress accelerated degradation reliability assessment arithmetic based on pseud failure lifetime and random degradation path were proposed;a numerical example was given to illustrate the method in the end. Compared with constant degradation testing,step-up-stress accelerated degradation testing can decrease testing time and reduce sample number hugely,so it has higher ratio of cost efficiency.