2006Unpublished venueRequires access

Reliability Assessment Based on Accelerated Degradation Data

Wang Ya-shun

12 citations

Abstract

In this paper,the analysis methods of accelerated life test and performance reliability are introduced into deal- ing with accelerated degradation test's data.And the method based performance degradation path and the ones based on distribution of performance degradation measures are proposed to assessing reliability of high-reliability long-lifetime products with accelerated degradation test data.A numerical example is given to illustrate application of both methods.

About this research paper

What this paper is about

In this paper,the analysis methods of accelerated life test and performance reliability are introduced into deal- ing with accelerated degradation test's data.And the method based performance degradation path and the ones based on distribution of performance degradation measures are proposed to assessing reliability of high-reliability long-lifetime products with accelerated degradation test data.A numerical example is given to illustrate application of both methods.

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OpenAlex reports 12 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

In this paper,the analysis methods of accelerated life test and performance reliability are introduced into deal- ing with accelerated degradation test's data.And the method based performance degradation path and the ones based on distribution of performance degradation measures are proposed to assessing reliability of high-reliability long-lifetime products with accelerated degradation test data.A numerical example is given to illustrate application of both methods.

Key concepts: Degradation (telecommunications), Reliability (semiconductor), Reliability engineering, Computer science, Test data, Path (computing), Engineering, Programming language

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