Research on reliability estimation and performance prediction based on step-up-stress accelerated degradation testing

In order to evaluate the reliability guidelines for electronic equipment with high reliability and long life quickly, this paper presents the method of step-up-stress accelerated degradation testing. First expatriate step-up-stress accelerated degradation testing and the basic assumptions is detailed, then gives the data conversion method from step up stress degradation data to constant stress degradation data. As the basis, propose step up stress accelerated degradation reliability assessment arithmetic based on random degradation path. A numerical example was given to illustrate the method in the end. The testing method overcomes the shortages of constant degradation testing, which has higher testing efficiency.