2005Physics ExperimentationRequires access

Design of digital Michelson interferometer

Chen Hong-cai

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Abstract

The digitalization measurement of Michelson interferometer is designed by using silicon photoelectricity dynatron as interference fringes sensor and the seperation of plates of the capaciton is varying.In our experiment,a singlechip microcontroller is used to record the interference fringes and measure automatically the tiny displacement of the reflector.For this purpose,the circuit and detection system and the corresponding software are designed.Due to the result of the wavelength measurement for He-Ne,this scheme is useful for reducing the measurement time and improving the precision.

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What this paper is about

The digitalization measurement of Michelson interferometer is designed by using silicon photoelectricity dynatron as interference fringes sensor and the seperation of plates of the capaciton is varying.In our experiment,a singlechip microcontroller is used to record the interference fringes and measure automatically the tiny displacement of the reflector.For this purpose,the circuit and detection system and the corresponding software are designed.Due to the result of the wavelength measurement for He-Ne,this scheme is useful for reducing the measurement time and improving the precision.

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Available abstract

The digitalization measurement of Michelson interferometer is designed by using silicon photoelectricity dynatron as interference fringes sensor and the seperation of plates of the capaciton is varying.In our experiment,a singlechip microcontroller is used to record the interference fringes and measure automatically the tiny displacement of the reflector.For this purpose,the circuit and detection system and the corresponding software are designed.Due to the result of the wavelength measurement for He-Ne,this scheme is useful for reducing the measurement time and improving the precision.

Key concepts: Michelson interferometer, Interference (communication), Interferometry, Microcontroller, Optics, Reflector (photography), Measure (data warehouse), Displacement (psychology)

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