SCM-based Improved Michelson Interferometer for Automatic Measurement of Tiny Length

In order to measure the wavelength of He-Ne laser and the thickness of a transparent thin film accurately,Michael interferometer with rotating of the fine-tuning hand-wheel driven by MCU controlled stepping motor is used,which makes the screen to show the stably-changed interference fringes.The stripe signal is detected by photosensitive diode,and then handled by the circuit of photoelectric conversion which converts light signal to electrical signal,which is transmitted into MCU for processing.The measuring result is automatically displayed on LCD.Automatic measurements in the general experimental environment was taken repeatly.Compared with the standard value,the modified Michelson interferometer has higher accuracy and higher efficiency.