Si/SiGe/Si HBT's DC Characterization and Its Low-frequency Noise
Liao Xiaoping
Abstract
Liao Xiaoping
Abstract
Based on the researches on Si/SiGe/Si HBT and its compatibility with Si process, one low noise Si/SiGe/Si HBT construction is fabricated. The HBT's DC characterization and its low frequency noise are measured and analyzed. Based on above researches, the better low noise Si/SiGe/Si HBT will be made out.
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Based on the researches on Si/SiGe/Si HBT and its compatibility with Si process, one low noise Si/SiGe/Si HBT construction is fabricated. The HBT's DC characterization and its low frequency noise are measured and analyzed. Based on above researches, the better low noise Si/SiGe/Si HBT will be made out.
Key concepts: Heterojunction bipolar transistor, Materials science, Infrasound, Optoelectronics, Noise (video), Low frequency, Silicon-germanium, Characterization (materials science)