2003•Journal of Electron DevicesRequires access

Si/SiGe/Si HBT's DC Characterization and Its Low-frequency Noise

Liao Xiaoping

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Abstract

Based on the researches on Si/SiGe/Si HBT and its compatibility with Si process, one low noise Si/SiGe/Si HBT construction is fabricated. The HBT's DC characterization and its low frequency noise are measured and analyzed. Based on above researches, the better low noise Si/SiGe/Si HBT will be made out.

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What this paper is about

Based on the researches on Si/SiGe/Si HBT and its compatibility with Si process, one low noise Si/SiGe/Si HBT construction is fabricated. The HBT's DC characterization and its low frequency noise are measured and analyzed. Based on above researches, the better low noise Si/SiGe/Si HBT will be made out.

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Available abstract

Based on the researches on Si/SiGe/Si HBT and its compatibility with Si process, one low noise Si/SiGe/Si HBT construction is fabricated. The HBT's DC characterization and its low frequency noise are measured and analyzed. Based on above researches, the better low noise Si/SiGe/Si HBT will be made out.

Key concepts: Heterojunction bipolar transistor, Materials science, Infrasound, Optoelectronics, Noise (video), Low frequency, Silicon-germanium, Characterization (materials science)

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