Reliability and validity of neuropsychological test battery for the elderly
Zhang Ming-yua
Abstract
Zhang Ming-yua
Abstract
Objective To determine the reliability and validity of the neuropsychological test battery for the elderly (NTBE). Methods The split-half reliability, internal consistency reliability, test-retest reliability and inter-rater reliability of NTBE system were evaluated. A factor analysis procedure was used to explore the factor structure of NTBE. The criterion-related validity was evaluated via the correlation between NTBE and mini-mental status examination (MMSE). Results The test-retested reliability of the NTBE subtests ranged from 0.64 to 0.916, and its split-half reliability was 0.85. The Pearson's correlation coefficient of the NTBE subtests ranged from 0.102 to 0.416. Factor analysis revealed that 6 initial eigenvalues could explain 61.38% of total square. Significant correlations were found between NTBE and MMSE. Conclusions The NTBE might be served as a good psychometric system for older patients, with sufficient reliability and validity.
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Objective To determine the reliability and validity of the neuropsychological test battery for the elderly (NTBE). Methods The split-half reliability, internal consistency reliability, test-retest reliability and inter-rater reliability of NTBE system were evaluated. A factor analysis procedure was used to explore the factor structure of NTBE. The criterion-related validity was evaluated via the correlation between NTBE and mini-mental status examination (MMSE). Results The test-retested reliability of the NTBE subtests ranged from 0.64 to 0.916, and its split-half reliability was 0.85. The Pearson's correlation coefficient of the NTBE subtests ranged from 0.102 to 0.416. Factor analysis revealed that 6 initial eigenvalues could explain 61.38% of total square. Significant correlations were found between NTBE and MMSE. Conclusions The NTBE might be served as a good psychometric system for older patients, with sufficient reliability and validity.
Key concepts: Reliability (semiconductor), Test (biology), Internal consistency, Neuropsychological test, Psychology, Neuropsychology, Statistics, Correlation