Measuring refractive index of medium plate by Michelson interferometer
Siyu Huang
Abstract
Siyu Huang
Abstract
The method for measuring the refractive index of thick medium plate is studied by means of Michelson interferometer.It is observed that the adjustment direction of reflector (M1) is abnormal when the medium plate is inserted.This phenomena is explained theoretically.A new formula about the relation between the moving distance of reflector (M1) in twice observations and the refractive index of the medium plate is derived.The validity of the formula is further proved by the experimental results.
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
The method for measuring the refractive index of thick medium plate is studied by means of Michelson interferometer.It is observed that the adjustment direction of reflector (M1) is abnormal when the medium plate is inserted.This phenomena is explained theoretically.A new formula about the relation between the moving distance of reflector (M1) in twice observations and the refractive index of the medium plate is derived.The validity of the formula is further proved by the experimental results.
Key concepts: Optics, Michelson interferometer, Refractive index, Interferometry, Reflector (photography), Refraction, Physics, Materials science