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Measuring refractive index of thick transparent material using Michelson interferometer

Zhou Hui-jun

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Abstract

A method to measure the refractive index of thick transparent material using the Michelson interferometer was presented.The stripe changed with the insertion of the transparent material into part of the optical path.The refractive index of the material was obtained by recording and analyzing the variations of the stripes,the error analysis of the result was presented.In addition,Zemax simulation was also carried out,which confirmed the feasibility.

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What this paper is about

A method to measure the refractive index of thick transparent material using the Michelson interferometer was presented.The stripe changed with the insertion of the transparent material into part of the optical path.The refractive index of the material was obtained by recording and analyzing the variations of the stripes,the error analysis of the result was presented.In addition,Zemax simulation was also carried out,which confirmed the feasibility.

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Available abstract

A method to measure the refractive index of thick transparent material using the Michelson interferometer was presented.The stripe changed with the insertion of the transparent material into part of the optical path.The refractive index of the material was obtained by recording and analyzing the variations of the stripes,the error analysis of the result was presented.In addition,Zemax simulation was also carried out,which confirmed the feasibility.

Key concepts: Optics, Zemax, Michelson interferometer, Refractive index, Interferometry, Materials science, Optical path length, Measure (data warehouse)

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