2013Physical Experiment of CollegeRequires access

The Refractive Index and Thickness of the Transparent Medium Measured by Michelson Interferometer

Wan We

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Abstract

This paper advances the methods of obtaining steady and clear equal thickness interference phenomena by applying Michelson interferometer,changing the incident manner of light source and observation manner.It explores how the measured transparent medium that is put in the light path influences equal thickness interference fringes and deduces the relationships between the measured medium thickness,refractive index or rotation angle and the moving amount of equal thickness interference fringes.The transparent medium thickness and refractive index can be simultaneously measured quickly.

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What this paper is about

This paper advances the methods of obtaining steady and clear equal thickness interference phenomena by applying Michelson interferometer,changing the incident manner of light source and observation manner.It explores how the measured transparent medium that is put in the light path influences equal thickness interference fringes and deduces the relationships between the measured medium thickness,refractive index or rotation angle and the moving amount of equal thickness interference fringes.The transparent medium thickness and refractive index can be simultaneously measured quickly.

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Available abstract

This paper advances the methods of obtaining steady and clear equal thickness interference phenomena by applying Michelson interferometer,changing the incident manner of light source and observation manner.It explores how the measured transparent medium that is put in the light path influences equal thickness interference fringes and deduces the relationships between the measured medium thickness,refractive index or rotation angle and the moving amount of equal thickness interference fringes.The transparent medium thickness and refractive index can be simultaneously measured quickly.

Key concepts: Michelson interferometer, Optics, Refractive index, Interference (communication), Interferometry, Optical path length, Rotation (mathematics), Materials science

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