Hervé Piombini, Philippe Vaorino, F. Sabary, Daniel Marteau, J. Dubard, J. Hameury, Jean-Rémy Filtz
Abstract
The spectrophotometer described is designed to measure specular reflectance with a high degree of accuracy. It can measure shape piece, antireflective or reflective coating and make cartographies in order to detect heterogeneities of coating.
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The spectrophotometer described is designed to measure specular reflectance with a high degree of accuracy. It can measure shape piece, antireflective or reflective coating and make cartographies in order to detect heterogeneities of coating.
Key concepts: Specular reflection, Anti-reflective coating, Reflectivity, Optics, Measure (data warehouse), Coating, Materials science, Computer science