HBD using cascode-Voltage switch logic gates for SET tolerant digital designs
Megan C. Casey, B. L. Bhuva, Jeff D. Black, L. W. Massengill
Abstract
Megan C. Casey, B. L. Bhuva, Jeff D. Black, L. W. Massengill
Abstract
Cascode-voltage-switch logic family of gates is evaluated for single-event vulnerability. As the data is stored on two storage nodes for each logic gate in this logic family, as opposed to only one for static logic family, the single-event transient pulse does not propagate for more than a few stages. Simulation results show single-event transient pulse termination after one logic gate. Area, speed, and power requirements for cascode-voltage logic are comparable to that of static logic.
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Cascode-voltage-switch logic family of gates is evaluated for single-event vulnerability. As the data is stored on two storage nodes for each logic gate in this logic family, as opposed to only one for static logic family, the single-event transient pulse does not propagate for more than a few stages. Simulation results show single-event transient pulse termination after one logic gate. Area, speed, and power requirements for cascode-voltage logic are comparable to that of static logic.
Key concepts: Pass transistor logic, Logic family, Logic gate, Cascode, Resistor–transistor logic, AND-OR-Invert, Logic level, Emitter-coupled logic