2003•Unpublished venueRequires access

Techniques to increase sequential ATPG performance

Enrico Macii, Angelo Raffaele Meo

Abstract

An automatic test pattern generation (ATPG) system for sequential circuits is described. Techniques such as testability measures, 9-valued functions, incompatibility function and fault simulation have been added to the basic algorithm in order to increase the fault coverage and reduce the test generation time. The entire ATPG system has been benchmarked on the set of ISCAS89 circuits.>

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Key concepts: Automatic test pattern generation, Testability, Computer science, Algorithm, Test set, Set (abstract data type), Fault coverage, Sequential logic