Bennett B. Goldberg
Abstract
Near-field scanning optical microscopy has been used to measure internal optical modes in photonic devices. By combining the standing mode period, transverse mode shape and decay constants, the values of all spatial components of the wavevector are determined.
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Near-field scanning optical microscopy has been used to measure internal optical modes in photonic devices. By combining the standing mode period, transverse mode shape and decay constants, the values of all spatial components of the wavevector are determined.
Key concepts: Photonics, Microscopy, Optics, Near-field scanning optical microscope, Optical microscope, Transverse plane, Photonic crystal, Materials science