2005Unpublished venueRequires access

Design of readout IC for uncooled infrared bolometer sensor using bias offset correction technique

Sang‐Won Park, Sang Joon Hwang, Eun Sik Jung, Man Young Sung

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Abstract

Infrared bolometer sensor's variation is detected by voltage drop between reference resistor and bolometer resistor in this architecture. One of the serious problems in this architecture is that these resistors value has a process variation. So common-mode level could be different from expectation in room temperature. Different common-mode level could lead to wrong output at the end of readout circuit. We suggest useful method to solve this problem. Difference correction using capacitor has reduced CM level difference to 86 % for 1 MOmega bolometer and reference resistor's 10 % variation

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What this paper is about

Infrared bolometer sensor's variation is detected by voltage drop between reference resistor and bolometer resistor in this architecture. One of the serious problems in this architecture is that these resistors value has a process variation. So common-mode level could be different from expectation in room temperature. Different common-mode level could lead to wrong output at the end of readout circuit. We suggest useful method to solve this problem. Difference correction using capacitor has reduced CM level difference to 86 % for 1 MOmega bolometer and reference resistor's 10 % variation

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Available abstract

Infrared bolometer sensor's variation is detected by voltage drop between reference resistor and bolometer resistor in this architecture. One of the serious problems in this architecture is that these resistors value has a process variation. So common-mode level could be different from expectation in room temperature. Different common-mode level could lead to wrong output at the end of readout circuit. We suggest useful method to solve this problem. Difference correction using capacitor has reduced CM level difference to 86 % for 1 MOmega bolometer and reference resistor's 10 % variation

Key concepts: Bolometer, Resistor, Capacitor, Offset (computer science), Process variation, Optoelectronics, Biasing, DC bias

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