A 12-Bit 1.25-GS/s DAC in 90 nm CMOS With $ > $70 dB SFDR up to 500 MHz
Wei-Hsin Tseng, Chi-Wei Fan, Jieh-Tsorng Wu
Abstract
Wei-Hsin Tseng, Chi-Wei Fan, Jieh-Tsorng Wu
Abstract
A current-steering digital-to-analog converter (DAC) was fabricated using a 90 nm CMOS technology. Its dynamic performance is enhanced by adopting a digital random return-to-zero (DRRZ) operation and a compact current cell design. The DRRZ also facilitates a current-cell background calibration technique that ensures the DAC static linearity. The measured differential nonlinearity (DNL) is 0.5 LSB and the integral nonlinearity (INL) is 1.2 LSB. At 1.25 GS/s sampling rate, the DAC achieves a spurious-free dynamic range (SFDR) better than 70 dB up to 500 MHz input frequency. The DAC occupies an active area of 1100 750 . It consumes a total of 128 mW from a 1.2 V and a 2.5 V supply.
OpenAlex reports 83 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
A current-steering digital-to-analog converter (DAC) was fabricated using a 90 nm CMOS technology. Its dynamic performance is enhanced by adopting a digital random return-to-zero (DRRZ) operation and a compact current cell design. The DRRZ also facilitates a current-cell background calibration technique that ensures the DAC static linearity. The measured differential nonlinearity (DNL) is 0.5 LSB and the integral nonlinearity (INL) is 1.2 LSB. At 1.25 GS/s sampling rate, the DAC achieves a spurious-free dynamic range (SFDR) better than 70 dB up to 500 MHz input frequency. The DAC occupies an active area of 1100 750 . It consumes a total of 128 mW from a 1.2 V and a 2.5 V supply.
Key concepts: Spurious-free dynamic range, Differential nonlinearity, Integral nonlinearity, CMOS, Least significant bit, Dynamic range, Linearity, Digital-to-analog converter