Depth measurement in a germanium strip detector
E. Wulf, J. Ampe, W. N. Johnson, R. A. Kroeger, J. D. Kurfess, B.E. Phlips
Abstract
E. Wulf, J. Ampe, W. N. Johnson, R. A. Kroeger, J. D. Kurfess, B.E. Phlips
Abstract
We have demonstrated the ability to determine the depth of a gamma-ray interaction point over the full active volume of a thick germanium strip detector. This capability provides depth resolution of less than 0.5-mm full width half maximum (FWHM) at 122 keV in a device 11 mm thick with a 2-mm strip pitch. Fifty channels of electronics have been developed and tested with a 25 /spl times/ 25 germanium orthogonal strip detectors. Experiments examining the capabilities of the system and demonstrating a simple Compton telescope using a single detector have been performed.
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We have demonstrated the ability to determine the depth of a gamma-ray interaction point over the full active volume of a thick germanium strip detector. This capability provides depth resolution of less than 0.5-mm full width half maximum (FWHM) at 122 keV in a device 11 mm thick with a 2-mm strip pitch. Fifty channels of electronics have been developed and tested with a 25 /spl times/ 25 germanium orthogonal strip detectors. Experiments examining the capabilities of the system and demonstrating a simple Compton telescope using a single detector have been performed.
Key concepts: Germanium, Detector, Semiconductor detector, Full width at half maximum, Optics, STRIPS, Physics, Nuclear electronics