Charge trapping correction in Ge spectrometers
Michael L. Simpson, T. W. Raudorf, Thomas J. Paulus, R.C. Trammel
Abstract
Michael L. Simpson, T. W. Raudorf, Thomas J. Paulus, R.C. Trammel
Abstract
A charge-trapping model is developed which does not require the assumption of shallow-level detrapping. The model shows the charge-trapping deficit to be proportional to S/sub 0/t/sup N/, where S/sub 0/ is the peak amplitude of the shaping amplifier pulse, t is the charge collection time for the carrier being trapped, and 1.5>
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A charge-trapping model is developed which does not require the assumption of shallow-level detrapping. The model shows the charge-trapping deficit to be proportional to S/sub 0/t/sup N/, where S/sub 0/ is the peak amplitude of the shaping amplifier pulse, t is the charge collection time for the carrier being trapped, and 1.5>
Key concepts: Full width at half maximum, Trapping, Particle detector, Semiconductor detector, Physics, Detector, Charge (physics), Atomic physics