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Kelvin Probe Force Microscopy of Semiconductors

Y. Rosenwaks, Shimon Saraf, Oren Tal, A. Schwarzman, Thilo Glatzel, Martha Ch. Lux‐Steiner

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Key concepts: Kelvin probe force microscope, Work function, Volta potential, Semiconductor, Work (physics), Dipole, Chemical physics, Nanotechnology

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