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2000•Microelectronics ReliabilityRequires access

Data retention prediction for modern floating gate non-volatile memories

Gang Tao, A. Scarpa, J. Dijkstra, W Stidl, Fred G. Kuper

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Key concepts: SILC, Data retention, Non-volatile memory, EEPROM, Quantum tunnelling, Reliability (semiconductor), Memory cell, Optoelectronics

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