1975•IEEE Transactions on ReliabilityRequires access

Some Applications of Regenerative Stochastic Processes to Reliability TheoryߞPart Two: Reliability and Availability of 2-Item Redundant Systems

Alessandro Birolini

Open publisher page 64 citations

Abstract

Part-two uses regenerative processes to develop very general expressions for the reliability and for the point-availability of a system composed of two s-identical, repairable items working in warm redundancy. It is assumed that: a) the failure rate is arbitrary in the operating state, but constant in the reserve state, b) the repair rates are arbitrary, c) the system has only one repair crew and has no preventive maintenance, d) switching is perfect. The results for this model are then successively simplified to cover some well known particular cases.

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Part-two uses regenerative processes to develop very general expressions for the reliability and for the point-availability of a system composed of two s-identical, repairable items working in warm redundancy. It is assumed that: a) the failure rate is arbitrary in the operating state, but constant in the reserve state, b) the repair rates are arbitrary, c) the system has only one repair crew and has no preventive maintenance, d) switching is perfect. The results for this model are then successively simplified to cover some well known particular cases.

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Available abstract

Part-two uses regenerative processes to develop very general expressions for the reliability and for the point-availability of a system composed of two s-identical, repairable items working in warm redundancy. It is assumed that: a) the failure rate is arbitrary in the operating state, but constant in the reserve state, b) the repair rates are arbitrary, c) the system has only one repair crew and has no preventive maintenance, d) switching is perfect. The results for this model are then successively simplified to cover some well known particular cases.

Key concepts: Redundancy (engineering), Reliability engineering, Reliability theory, Reliability (semiconductor), Failure rate, Crew, Cover (algebra), Computer science

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