1988•IEEE Transactions on ReliabilityRequires access

Reliability of an m-out of-n system when component failure induces higher failure rates in survivors

Ernest M. Scheuer

Open publisher page 102 citations

Abstract

An m-out-of-n:G system is composed of statistically independent and identically distributed components with exponential lifetimes. The reliability of such a system is obtained under the assumption that the failure of a component changes the failure rate of the surviving components.>

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An m-out-of-n:G system is composed of statistically independent and identically distributed components with exponential lifetimes. The reliability of such a system is obtained under the assumption that the failure of a component changes the failure rate of the surviving components.>

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Available abstract

An m-out-of-n:G system is composed of statistically independent and identically distributed components with exponential lifetimes. The reliability of such a system is obtained under the assumption that the failure of a component changes the failure rate of the surviving components.>

Key concepts: Failure rate, Reliability (semiconductor), Component (thermodynamics), Reliability theory, Reliability engineering, Independent and identically distributed random variables, Exponential distribution, Exponential function

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