Reliability of an m-out of-n system when component failure induces higher failure rates in survivors
Ernest M. Scheuer
Abstract
Ernest M. Scheuer
Abstract
An m-out-of-n:G system is composed of statistically independent and identically distributed components with exponential lifetimes. The reliability of such a system is obtained under the assumption that the failure of a component changes the failure rate of the surviving components.>
OpenAlex reports 102 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
An m-out-of-n:G system is composed of statistically independent and identically distributed components with exponential lifetimes. The reliability of such a system is obtained under the assumption that the failure of a component changes the failure rate of the surviving components.>
Key concepts: Failure rate, Reliability (semiconductor), Component (thermodynamics), Reliability theory, Reliability engineering, Independent and identically distributed random variables, Exponential distribution, Exponential function