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1970•IEEE Transactions on ReliabilityRequires access

Some Bounds for the Reliability of a System With Specified Failure Rate Characteristics

Yoram Kinberg, E. Shlifer

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Abstract

When bounds are sought for the reliability of a system, all available information is applied, e.g., moments of the life distribution (mainly the first moment), life percentiles obtained experimentally, and general data. Barlow et al. [1] and Epstein [2] presented bounds for a monotone-increasing or decreasing failure rate, and bounded the reliability by referring to a system with a constant failure rate. In this paper, the reliability is bounded by utilizing additional information on the behavior of the failure rate as a function of age.

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What this paper is about

When bounds are sought for the reliability of a system, all available information is applied, e.g., moments of the life distribution (mainly the first moment), life percentiles obtained experimentally, and general data. Barlow et al. [1] and Epstein [2] presented bounds for a monotone-increasing or decreasing failure rate, and bounded the reliability by referring to a system with a constant failure rate. In this paper, the reliability is bounded by utilizing additional information on the behavior of the failure rate as a function of age.

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Available abstract

When bounds are sought for the reliability of a system, all available information is applied, e.g., moments of the life distribution (mainly the first moment), life percentiles obtained experimentally, and general data. Barlow et al. [1] and Epstein [2] presented bounds for a monotone-increasing or decreasing failure rate, and bounded the reliability by referring to a system with a constant failure rate. In this paper, the reliability is bounded by utilizing additional information on the behavior of the failure rate as a function of age.

Key concepts: Failure rate, Bounded function, Reliability (semiconductor), Reliability theory, Reliability engineering, Monotone polygon, Moment (physics), Percentile

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