Near-field and far-field modeling of scattered surface waves. Application to the apertureless scanning near-field optical microscopy
Jérôme Müller, Gilles Parent, Sébastien Fumeron, G. Jeandel, David Lacroix
Abstract
Jérôme Müller, Gilles Parent, Sébastien Fumeron, G. Jeandel, David Lacroix
Abstract
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Key concepts: Near-field scanning optical microscope, Near and far field, Optics, Finite-difference time-domain method, Field (mathematics), Electromagnetic field, Optical microscope, Microscopy