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2002•Unpublished venueRequires access

Optimisation of near-field optical probes

Mikhail N. Libenson, Gleb S. Zhdanov

Open publisher page 1 citations

Abstract

The most important part of a scanning near-field optical microscope (SNOM) is an optical probe that is scanned along the object at a very small distance. The probe tip is usually the tapered end of an optical monomode fiber. In various types of SNOM tips with and without metal coating are: utilized. In the aperture SNOM (a-SNOM) the tip is overcoated by a metal except for a small aperture at the apex. In the photon scanning tunneling microscope (PSTM) the bare quartz tip is used to detect the evanescent field near the sample.

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What this paper is about

The most important part of a scanning near-field optical microscope (SNOM) is an optical probe that is scanned along the object at a very small distance. The probe tip is usually the tapered end of an optical monomode fiber. In various types of SNOM tips with and without metal coating are: utilized. In the aperture SNOM (a-SNOM) the tip is overcoated by a metal except for a small aperture at the apex. In the photon scanning tunneling microscope (PSTM) the bare quartz tip is used to detect the evanescent field near the sample.

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Available abstract

The most important part of a scanning near-field optical microscope (SNOM) is an optical probe that is scanned along the object at a very small distance. The probe tip is usually the tapered end of an optical monomode fiber. In various types of SNOM tips with and without metal coating are: utilized. In the aperture SNOM (a-SNOM) the tip is overcoated by a metal except for a small aperture at the apex. In the photon scanning tunneling microscope (PSTM) the bare quartz tip is used to detect the evanescent field near the sample.

Key concepts: Near-field scanning optical microscope, Optical microscope, Optics, Materials science, Near-field optics, Aperture (computer memory), Microscope, Near and far field

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